metria: digital photogrammetry for architecture, heritage, engineering and industry

Metria will attend the XXIth International CIPA Symposium. [ September 2007 ]

Metria will attend the XXIth International CIPA Symposium that will be held in Athens, Greece, from 1 to 6 October 2007. The theme of this biennial Symposium is "AntiCIPAting the future of the cultural past". This is one of the most important events related to the improvement of all method for surveying of cultural monuments and sites, where Metria will expose the last advances related to its specific and easy-to-use software application for practical and accurate commercial generation of high quality true architectural orthophotos, based on simple field documentation procedures. [ More ]

Metria was present at the 3D-Arch'2007 international event. [ July 2007 ]

Metria attended the 2nd international workshop 3D-Arch'2007 celebrated on 12 and 13 July in Zürich, Switzerland, organized by the Eidgenössische Technische Hochschule (Swiss Federal Institute of Technology) ETH Zürich. This year the event motto was "3D Virtual Reconstruction and Visualization of Complex Architectures". Among the participants, over 65 people coming from different countries world wide, Metria was one of the few private assistant companies. A poster related to its utility model for the generation of true architectural orthophotos of building facades was shown. [ More ]

The Spanish Metrology Center (CEM) will validate the measurement system of Metria Digital. [ March 2007 ]

Within the framework of the project "Automatic generation of true orthophotographs in architecture and study of other applications", promoted by the company in cooperation with other technological centers and universities of the country, to study, among other objectives, the traceability of the optic-based metrology system of the company, a number of experiments were undertaken with a view to comparing the measurements realized using metria's close-range photogrammetry with a contrasted measurement system. Different cameras and lenses were used and the obtained measurements were compared with those carried out by CEM with an industrial high precision total station.